PPT Slide
CSCI: Process Scan Events
- Test data generated during Engineering
Calibration will command instrument through
all scan modes. The output Level 1A file can
be analyzed to verify that the data were correctly
processed, merged and output in the correct format
for each scan event & scan mode.
- Will simulate MDC generated data using HALOE
SABER Ground Processing - Critical Design Review, July 1, 1998